发明名称 PLASMA PROCESS SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a plasma process system advantageous in terms of cost, and capable of attaining a uniform plasma process even in the case that the load impedance of plasma produced in a reaction chamber varies. SOLUTION: A plurality of microwave introducing windows 2a, 2b are disposed in the upper wall 1a of a reaction chamber 1. Microwaves of identical electric power are applied to the microwave introducing windows 2a, e.g. two in number, located in equivalent positions in the positional relationship with a side wall 1b of the reaction chamber 1 and microwaves of dissimilar electric power are applied to the microwave introducing windows 2a, 2b, e.g. two in number, in the nonequivalent positional relationship.
申请公布号 JP2001192840(A) 申请公布日期 2001.07.17
申请号 JP20000005673 申请日期 2000.01.14
申请人 SHARP CORP;OMI TADAHIRO 发明人 YAMAMOTO TATSUSHI;OKAMOTO MASAYA;HIRAYAMA MASAKI;OMI TADAHIRO
分类号 H01L21/302;C23C16/511;H01J37/32;H01L21/205;H01L21/3065;H05H1/46 主分类号 H01L21/302
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