发明名称 Process of making polysilicon resistor
摘要 A method of forming an integrated circuit device including at least one polysilicon resistor 10 is disclosed herein. A polysilicon layer 24 is formed, possibly over a field oxide 12. The polysilicon layer 24 is then doped to achieve a selected sheet resistance. An insulating layer 18 (e.g., an oxide, a nitride, or a combination thereof) is then formed over the polysilicon layer 24. The insulating layer 18 is patterned and etched to define a resistor body 14 in the underlying polysilicon layer 24. The polysilicon layer 24 is then patterned and etched to define first and second resistor heads 16 abutting the resistor body 14 while simultaneously at least one polysilicon element 28 of a second electronic device is formed. Other systems and methods are also disclosed.
申请公布号 US6261915(B1) 申请公布日期 2001.07.17
申请号 US19940247910 申请日期 1994.05.23
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 EKLUND ROBERT H.;HAVEMANN ROBERT H.;STROTH LEO
分类号 H01L21/02;(IPC1-7):H01L21/321 主分类号 H01L21/02
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