发明名称 Field effect transistor structure with partially isolated source/drain junctionsand methods of making same
摘要 A microelectronic structure includes at least one source/drain terminal of a first conductivity type that is partially isolated from a region of semiconductor material of a second conductivity type. In a further aspect of the invention, a process for forming a microelectronic structure, such as a MOSFET, having at least one source/drain terminal of a first conductivity type that is partially isolated from a region of semiconductor material of a second conductivity type includes forming a recess having a surface, forming a dielectric material over a portion of the surface of the recess, and back-filling the recess to from a source/drain terminal.
申请公布号 AU4305701(A) 申请公布日期 2001.07.16
申请号 AU20010043057 申请日期 2000.11.27
申请人 INTEL CORPORATION 发明人 ANAND S. MURTHY;ROBERT S CHAU;PATRICK MORROW;ROBERT S. MCFADDEN
分类号 H01L21/336;H01L29/06 主分类号 H01L21/336
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