发明名称 HIGH DIELECTRIC CONSTANT MATERIAL DEPOSITION TO ACHIEVE HIGH CAPACITANCE
摘要 <p>A method for forming a dielectric layer includes exposing a surface to a first dielectric material in gaseous form at a first temperature (Step 100). Nuclei of the first dielectric material are formed on the surface (Step 104). A layer of a second dielectric material is deposited on the surface (Step 108) by employing the nuclei as seeds for layer growth wherein the depositing is performed at a second temperature which is greater than the first temperature.</p>
申请公布号 WO2001050509(A1) 申请公布日期 2001.07.12
申请号 US2001000184 申请日期 2001.01.04
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