发明名称 SEMICONDUCTOR AND ITS FABRICATING METHOD
摘要 PURPOSE: A semiconductor and its fabricating method are provided to fabricate of both compact memory and high performance logic on the same semiconductor chip. CONSTITUTION: An unreacted cobalt or titanium(66) covering the horizontal surfaces of the nitride logic spacer(62) is removed by a wet etching process. Then a barrier nitride layer(72) is deposited over the entire surface of chip(9), followed by a dielectric(73) such as a layer of flowable doped glass, for example Boro-Phospho Silicate Glass(BPSG) or fluorinated BPSG(F-BPSG), which is then densified. Dielectric(73) may be polished level with memory gate stack(42), or may extend above the stack(42) by several thousand Angstroms.
申请公布号 KR20010067355(A) 申请公布日期 2001.07.12
申请号 KR20000063259 申请日期 2000.10.26
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION. 发明人 AGNELLO PAUL D.;CHEN BOMY A.;CROWDER SCOTT W.;DIVAKARUNI RAMACHANDRA;IYER SURBRAMANIAN S;SINITSKY DENNIS
分类号 H01L21/8234;H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/8234
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