发明名称 BLIND SYSTEM FOR MANUFACTURING PROCESS OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A blind system for a manufacturing process of a semiconductor device is provided to eliminate a particle source caused by defocus, by excluding an unnecessary chip in an outermost shot of a wafer when an exposure process is performed by using the blind system. CONSTITUTION: N chips(N is a positive integer) on a wafer are formed as one shot, and a main blind makes a pattern projected through a lens exposed to the N chips. A main motor(X1,Y1,X2,Y2) moves the main blind in an X axis and a Y axis to control the size of the shot. A sub blind(51,52,53,54,55,56,57,58) selects a predetermined chip from the N chips in the shot formed by the main blind, and performs an exposure process regarding the pattern projected through the lens. A sub motor(X11-X18,Y11-Y18) moves the sub blind in an X axis and a Y axis to control the position of the main blind.
申请公布号 KR20010066286(A) 申请公布日期 2001.07.11
申请号 KR19990067885 申请日期 1999.12.31
申请人 ANAM SEMICONDUCTOR., LTD. 发明人 HWANG, TAE UNG
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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