发明名称 |
METHOD FOR MANUFACTURING MOS TYPE TRANSISTOR |
摘要 |
PURPOSE: A method for manufacturing a MOS type transistor is provided to improve an electric characteristic of the transistor by controlling the threshold voltage and the hot carrier immunity. CONSTITUTION: The method for manufacturing a MOS type transistor sequentially stacks a gate oxide film(15) and a gate electrode layer(20) on a semiconductor substrate(10). The gate oxide film and the gate electrode layer are masking-etched to form a gate. A silicide layer is deposited on the resulting surface and is then blanket-etched to form a silicide spacer(25) at both sides of the gate. Ions are firstly injected to form a source/drain region. The first spacer layer is stacked on the resulting surface and is blanket-etched to form the first spacer(30a) at both sides of the silicide spacer. Ions are secondly injected into the source/drain region. The second spacer layer is stacked on the resulting surface and is then blanket-etched to form the second spacer at both sides of the first spacer. Ions are thirdly injected into the source/drain region.
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申请公布号 |
KR20010065744(A) |
申请公布日期 |
2001.07.11 |
申请号 |
KR19990065681 |
申请日期 |
1999.12.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHA, HUI DON;CHA, JAE HAN |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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