发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is to uniformly oxidize a silicon surface by simultaneously injecting an oxygen gas and a hydrogen gas under a high temperature and a low pressure atmosphere. CONSTITUTION: A pad oxide film(102) is formed on a substrate(100), and a pad nitride film(104) is deposited on the pad oxide film. The pad nitride film and the pad oxide film are patterned through a lithography and etching process using an isolation mask. The exposed substrate is selectively etched by a desired depth to form a trench. After the substrate is loaded into an annealing chamber, an oxygen gas and a hydrogen gas are injected into the chamber to deposit a sacrificial film(106) on a sidewall and bottom of the trench. After the sacrificial film is removed, a liner oxide film(108) is deposited in the trench under a same condition as that of the sacrificial film forming process. The trench is buried with a gap fill oxide film(110) through a high density plasma process.
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申请公布号 |
KR20010066383(A) |
申请公布日期 |
2001.07.11 |
申请号 |
KR19990068092 |
申请日期 |
1999.12.31 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
HONG, BYEONG SEOP;LIM, JAE EUN |
分类号 |
H01L21/76;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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