发明名称 |
WAFER CARRIER FOR CHEMICAL MECHANICAL POLISHING APPARATUS |
摘要 |
PURPOSE: A wafer carrier for a chemical mechanical polishing(CMP) apparatus is to obtain a uniform wide planarization by preventing an upper plate from being directly contacted with the carrier base. CONSTITUTION: The wafer carrier comprises a carrier base(23), an upper plate(24), an O-ring(26) and a gas layer(27). A groove is formed on an upper portion of the carrier base. A carrier pad(21) for holding the carrier base is formed on a lower portion of the carrier base. The carrier pad has the same diameter as the wafer. A wafer guide(22) formed on the carrier base holds a position of the wafer on an outer side of the carrier pad. The upper plate connected to a driving load is connected to an upper groove of the carrier base. A lower portion of the upper plate is formed evenly. The O-ring is installed on a lower outer circumference of the upper groove. The gas layer is formed between a lower portion of the upper groove and a lower portion of the upper plate.
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申请公布号 |
KR20010066158(A) |
申请公布日期 |
2001.07.11 |
申请号 |
KR19990067743 |
申请日期 |
1999.12.31 |
申请人 |
ANAM SEMICONDUCTOR., LTD. |
发明人 |
PARK, HYEONG YEOL;YOON, DAE RYEONG |
分类号 |
H01L21/302;(IPC1-7):H01L21/302 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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