发明名称 |
METHOD FOR MANUFACTURING THIN FILM TRANSISTOR |
摘要 |
PURPOSE: A method for manufacturing a thin film transistor is to provide a thermal oxide layer having a high uniformity by stacking a doped amorphous silicon thin film and an undoped amorphous silicon thin film to thereby form a gate electrode. CONSTITUTION: An insulating layer(100) is formed on a semiconductor substrate. A gate conductive layer(110) is formed on the insulating layer. The gate conductive layer includes a doped amorphous silicon thin film(111) and an undoped amorphous silicon thin film(112). A gate insulating layer(120) is formed on the gate conductive layer. A channel polysilicon layer(130) is formed on the gate insulating layer. Impurity ions are selectively implanted on the channel polysilicon layer to thereby form a source/drain region(150). The doped amorphous silicon thin film is formed through an LP-CVD(low pressure chemical vapor deposition) process using an Si source gas, such as SiH4 and Si2H6, and PH3 source gas.
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申请公布号 |
KR20010066393(A) |
申请公布日期 |
2001.07.11 |
申请号 |
KR19990068102 |
申请日期 |
1999.12.31 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
DONG, CHA DEOK;KIM, HAK DONG |
分类号 |
H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L29/786 |
代理机构 |
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主权项 |
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地址 |
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