发明名称 METHOD FOR FORMING CONTACT HOLE IN SEMICONDUCTOR DEVICES
摘要 PURPOSE: A method for forming a contact hole in semiconductor devices is provided to prevent short between electrodes buried within a contact hole by growing a thermal oxide film in a gate electrode or a bit line that are exposed into the contact hole when the contact hole is formed. CONSTITUTION: The method for forming a contact hole in semiconductor devices forms a bit line contact hole or a lower electrode contact hole of a capacitor. Thermal oxide films(100) are grown in a substrate(10) exposed within the bit line contact hole or the lower electrode contact hole, a gate electrode(40) or a bit line. The thermal oxide films(100) formed on the substrate(10) are etched. The bit line contact hole or the lower electrode contact hole are buried to form bit lines and a lower electrode(110).
申请公布号 KR20010065335(A) 申请公布日期 2001.07.11
申请号 KR19990065208 申请日期 1999.12.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, JEONG HWAN
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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