发明名称 APPARATUS FOR TESTING SHORT-CIRCUITING AND OVERLOAD
摘要 PURPOSE: An apparatus for testing both of short-circuiting and overload is provided which tests the short-circuiting and overload using commercial power without requiring a separate device. CONSTITUTION: An apparatus tests an object using a power input unit, a protector including a breaker and a switch, and controller for controlling an input power voltage to be converted into a voltage value for test. The apparatus includes a means(53) for selecting the kind of a test, and a load controller(55) for converting the test voltage value into a required current value to apply the current value to the object to be tested according to the current value needed for the selected kind of the test. The apparatus further has a means for short-circuiting the object to which the current value was applied, and a means for measuring and recording test data values including the voltage and current applied to the object and operation time.
申请公布号 KR20010065096(A) 申请公布日期 2001.07.11
申请号 KR19990064910 申请日期 1999.12.29
申请人 KOREA ELECTRICAL SAFETY CORPORATION 发明人 CHOI, CHUNG SEOK;KIM, HYANG GON
分类号 G01R31/02;(IPC1-7):G01R31/02 主分类号 G01R31/02
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