发明名称 |
COOLING STATION OF LOADLOCK CHAMBER FOR CHEMICAL VAPOR DEPOSITION PROCESS |
摘要 |
PURPOSE: A cooling station of a loadlock chamber for the chemical vapor deposition process is provided which not only enables loading and unloading of a wafer nicely but also does not cause damage of the wafer by expanding the inserting and receiving space for a wafer. CONSTITUTION: In a cooling station of a loadlock chamber for the chemical vapor deposition process comprising N units of receiving stations (30) installed between the upper and lower plates (10,20) so as to insert and safely receiving a plurality of wafers (50), and inserting grooves having a height of H formed between the receiving stations, the cooling station of a loadlock chamber for the chemical vapor deposition process is characterized in that the receiving stations (30) are reduced to (N-ΔN) units so that loading and unloading of a wafer is easily performed, and the inserting grooves are expanded so that the inserting grooves (34) have a width of (H+ΔH), wherein a unit variation (ΔN) of the receiving stations is from 1 to 6, and a width variation (ΔH) of the inserting grooves is from 2 to 6 mm.
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申请公布号 |
KR20010066354(A) |
申请公布日期 |
2001.07.11 |
申请号 |
KR19990068063 |
申请日期 |
1999.12.31 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUNG, MYEONG HUN;YOO, SEUNG JIN |
分类号 |
C23C16/00;(IPC1-7):C23C16/00 |
主分类号 |
C23C16/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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