发明名称 COOLING STATION OF LOADLOCK CHAMBER FOR CHEMICAL VAPOR DEPOSITION PROCESS
摘要 PURPOSE: A cooling station of a loadlock chamber for the chemical vapor deposition process is provided which not only enables loading and unloading of a wafer nicely but also does not cause damage of the wafer by expanding the inserting and receiving space for a wafer. CONSTITUTION: In a cooling station of a loadlock chamber for the chemical vapor deposition process comprising N units of receiving stations (30) installed between the upper and lower plates (10,20) so as to insert and safely receiving a plurality of wafers (50), and inserting grooves having a height of H formed between the receiving stations, the cooling station of a loadlock chamber for the chemical vapor deposition process is characterized in that the receiving stations (30) are reduced to (N-ΔN) units so that loading and unloading of a wafer is easily performed, and the inserting grooves are expanded so that the inserting grooves (34) have a width of (H+ΔH), wherein a unit variation (ΔN) of the receiving stations is from 1 to 6, and a width variation (ΔH) of the inserting grooves is from 2 to 6 mm.
申请公布号 KR20010066354(A) 申请公布日期 2001.07.11
申请号 KR19990068063 申请日期 1999.12.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG, MYEONG HUN;YOO, SEUNG JIN
分类号 C23C16/00;(IPC1-7):C23C16/00 主分类号 C23C16/00
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