发明名称 ROW DECODER CIRCUIT OF FLASH MEMORY
摘要 PURPOSE: A row decoder circuit of a flash memory is provided to reject current increasing due to temperature variation by strictly verifying with a voltage higher than zero volt, in order to increase low source voltage program efficiency at high temperature. CONSTITUTION: The row decoder circuit includes a switch, a negative gate bias generator(10), a post program verifying bias generator(20), a logic gate(30) and a switching device(N3). The switch drives the word line of the flash memory cell. The negative gate bias generator includes an output node connected with the switch in order to output a negative voltage to the switch when an erase signal is enabled. The post program verifying bias generator includes an output node connected with the switch in order to output a voltage higher than a predetermined level to the switch when a post-programming verifying signal is enabled. The logic gate outputs the switching signal according to the state of the erase signal and the post-programming verifying signal. The switching device is switched by the output signal of the logic gate and controls the voltage applied on the switch.
申请公布号 KR20010065227(A) 申请公布日期 2001.07.11
申请号 KR19990065099 申请日期 1999.12.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, JU YEONG;KWON, O WON;LEE, PUNG YEOP;SEO, SEONG HWAN;SHIN, GYE WAN
分类号 G11C16/04;(IPC1-7):G11C16/04 主分类号 G11C16/04
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