发明名称 |
ROW DECODER CIRCUIT OF FLASH MEMORY |
摘要 |
PURPOSE: A row decoder circuit of a flash memory is provided to reject current increasing due to temperature variation by strictly verifying with a voltage higher than zero volt, in order to increase low source voltage program efficiency at high temperature. CONSTITUTION: The row decoder circuit includes a switch, a negative gate bias generator(10), a post program verifying bias generator(20), a logic gate(30) and a switching device(N3). The switch drives the word line of the flash memory cell. The negative gate bias generator includes an output node connected with the switch in order to output a negative voltage to the switch when an erase signal is enabled. The post program verifying bias generator includes an output node connected with the switch in order to output a voltage higher than a predetermined level to the switch when a post-programming verifying signal is enabled. The logic gate outputs the switching signal according to the state of the erase signal and the post-programming verifying signal. The switching device is switched by the output signal of the logic gate and controls the voltage applied on the switch.
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申请公布号 |
KR20010065227(A) |
申请公布日期 |
2001.07.11 |
申请号 |
KR19990065099 |
申请日期 |
1999.12.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, JU YEONG;KWON, O WON;LEE, PUNG YEOP;SEO, SEONG HWAN;SHIN, GYE WAN |
分类号 |
G11C16/04;(IPC1-7):G11C16/04 |
主分类号 |
G11C16/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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