发明名称 SEMICONDUCTOR FILM FORMING METHOD, AND MANUFACTURING METHOD OF THIN-FILM SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor film forming method for forming a high- quality semiconductor film on a substrate. SOLUTION: A semiconductor film forming method for forming a semiconductor film on a substrate by utilizing a bias catalyzer CVD, a high-density bias catalyzer CVD, a bias reduced-pressure CVD, or a bias ordinary-pressure CVD. The method has a process wherein a raw-material gas is fed to a vacuum vessel 1 and a voltage which is not higher than a glow-discharge starting voltage is so applied across a substrate 10 and an electrode 3a, which are disposed in the vacuum vessel 1 as to form a semiconductor film and an insulation film on the substrate 10, a processor for projecting a laser on the semiconductor film and the insulation film for annealing the films, and a process preceded by this annealing process, where the films are annealed with a water steam.
申请公布号 JP2001189275(A) 申请公布日期 2001.07.10
申请号 JP19990371343 申请日期 1999.12.27
申请人 SONY CORP 发明人 YAMANAKA HIDEO
分类号 H01L21/205;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/205 主分类号 H01L21/205
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