发明名称 |
X-ray imaging crystal spectrometer for extended X-ray sources |
摘要 |
Spherically or toroidally curved, double focusing crystals are used in a spectrometer for X-ray diagnostics of an extended X-ray source such as a hot plasma produced in a tokomak fusion experiment to provide spatially and temporally resolved data on plasma parameters using the imaging properties for Bragg angles near 45. For a Bragg angle of 45°, the spherical crystal focuses a bundle of near parallel X-rays (the cross section of which is determined by the cross section of the crystal) from the plasma to a point on a detector, with parallel rays inclined to the main plain of diffraction focused to different points on the detector. Thus, it is possible to radially image the plasma X-ray emission in different wavelengths simultaneously with a single crystal.
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申请公布号 |
US6259763(B1) |
申请公布日期 |
2001.07.10 |
申请号 |
US19990315834 |
申请日期 |
1999.05.21 |
申请人 |
THE UNITED STATES OF AMERICA AS REPRESENTED BY THE UNITED STATES DEPARTMENT OF ENERGY |
发明人 |
BITTER MANFRED L.;FRAENKEL BEN;GORMAN JAMES L.;HILL KENNETH W.;ROQUEMORE A. LANE;STODIEK WOLFGANG;VON GOELER SCHWEICKHARD E. |
分类号 |
G01N23/20;G01T1/36;(IPC1-7):G01T1/36 |
主分类号 |
G01N23/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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