发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 <p>PROBLEM TO BE SOLVED: To remove or reduce impurity elements in the vicinity of the junction of a thin-film transistor. SOLUTION: The impurity element, such as a 3d transition metal, can be moved into a region far from the junction regions of a channel-forming region and a drain region by doping the element represented by P(phosphorus) in a region, in which source/drain are formed, and forming a gradient to the concentration distribution. That is, the impurity element in the vicinity of the junction regions can be gettered effectively, by lowering the concentration of the element represented by P in sections close to the junction regions and enhancing the concentration of the element represented by P in sections separated from the junction regions.</p>
申请公布号 JP2001189459(A) 申请公布日期 2001.07.10
申请号 JP19990372214 申请日期 1999.12.28
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 ONUMA HIDETO
分类号 H01L21/20;G02F1/136;G02F1/1365;G02F1/1368;H01L21/322;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L21/20
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