发明名称 |
System and method for fabricating semiconductor device and isolation structure thereof |
摘要 |
A method for fabricating a semiconductor device and an isolation structure thereof is disclosed. The isolation structure of a semiconductor device includes a first isolation step for forming a line-shaped active region on a semiconductor substrate wherein the line-shaped active region is consecutive in a lengthy direction, and a second isolation step for electrically isolating the line-shaped active regions in a lengthy direction by a predetermined length for thereby overcoming the problems such as a rounded corner portion problem, a pattern length decrease, etc. and enhancing the integrity of the semiconductor device.
|
申请公布号 |
US6258696(B1) |
申请公布日期 |
2001.07.10 |
申请号 |
US19990396449 |
申请日期 |
1999.09.15 |
申请人 |
HYUNDAI ELECTRONICS INDUSTRIES CO., LTD |
发明人 |
LEE MYOUNG GOO;YOON TAK HYUN |
分类号 |
H01L21/762;(IPC1-7):H01L21/762 |
主分类号 |
H01L21/762 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|