发明名称 System and method for fabricating semiconductor device and isolation structure thereof
摘要 A method for fabricating a semiconductor device and an isolation structure thereof is disclosed. The isolation structure of a semiconductor device includes a first isolation step for forming a line-shaped active region on a semiconductor substrate wherein the line-shaped active region is consecutive in a lengthy direction, and a second isolation step for electrically isolating the line-shaped active regions in a lengthy direction by a predetermined length for thereby overcoming the problems such as a rounded corner portion problem, a pattern length decrease, etc. and enhancing the integrity of the semiconductor device.
申请公布号 US6258696(B1) 申请公布日期 2001.07.10
申请号 US19990396449 申请日期 1999.09.15
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD 发明人 LEE MYOUNG GOO;YOON TAK HYUN
分类号 H01L21/762;(IPC1-7):H01L21/762 主分类号 H01L21/762
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