发明名称 |
Bond pad for stress releif between a substrate and an external substrate |
摘要 |
A metal pattern 4 is formed at a rear surface of a substrate 3 at a front surface of which a molded semiconductor chip is mounted, the metal pattern 4 is covered with an insulating film 5 except at its connecting area 4a and a solder ball 6 is bonded to the connecting area 4a. The area of the metal pattern 4 other than the connecting area 4a inclines toward the substrate 3 and gradually becomes thinner toward the outside. Stress, which is applied to the solder ball 6, is imparted in a diagonal direction and is dispersed. As a result, the number of occurrences of cracks X is reduced and the solder ball which is used to achieve connection with an external substrate is effectively prevented from becoming electrically disconnected.
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申请公布号 |
US6259163(B1) |
申请公布日期 |
2001.07.10 |
申请号 |
US19980167529 |
申请日期 |
1998.10.07 |
申请人 |
OKI ELECTRIC INDUSTRY CO., LTD. |
发明人 |
OHUCHI SHINJI;EGAWA YOSHIMI;ANZAI NORITAKA |
分类号 |
H01L21/48;H01L21/60;H01L23/12;H01L23/498;H05K3/34;H05K3/40;(IPC1-7):H01L23/48 |
主分类号 |
H01L21/48 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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