发明名称 Bond pad for stress releif between a substrate and an external substrate
摘要 A metal pattern 4 is formed at a rear surface of a substrate 3 at a front surface of which a molded semiconductor chip is mounted, the metal pattern 4 is covered with an insulating film 5 except at its connecting area 4a and a solder ball 6 is bonded to the connecting area 4a. The area of the metal pattern 4 other than the connecting area 4a inclines toward the substrate 3 and gradually becomes thinner toward the outside. Stress, which is applied to the solder ball 6, is imparted in a diagonal direction and is dispersed. As a result, the number of occurrences of cracks X is reduced and the solder ball which is used to achieve connection with an external substrate is effectively prevented from becoming electrically disconnected.
申请公布号 US6259163(B1) 申请公布日期 2001.07.10
申请号 US19980167529 申请日期 1998.10.07
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 OHUCHI SHINJI;EGAWA YOSHIMI;ANZAI NORITAKA
分类号 H01L21/48;H01L21/60;H01L23/12;H01L23/498;H05K3/34;H05K3/40;(IPC1-7):H01L23/48 主分类号 H01L21/48
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