发明名称 |
Electrooptic voltage waveform measuring method employing light sampling technique using Pockels effect |
摘要 |
An electrooptic voltage waveform measuring apparatus, which includes an electrooptic element having an electrooptic effect; a first electrode mounted on the electrooptic element and electrically coupled to an object to be measured; and a first light source irradiating a light on the electrooptic element. The electrooptic voltage waveform measuring apparatus further includes a polarization analyzer for analyzing a polarization state of the light passed through the electrooptic element and detecting a voltage waveform of the object; a second electrode mounted on the electrooptic element and separated from the first electrode; and an amplifier having an input terminal coupled to the second electrode and outputting a low-frequency component of the voltage waveform of the object. The electrooptic voltage waveform measuring apparatus further includes a voltage waveform combining processor obtaining a measured voltage waveform of the object by combining a high-frequency component of the voltage waveform of the object obtained from an output of the polarization analyzer and the low-frequency component of the voltage waveform of the object output from the amplifier.
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申请公布号 |
US6259244(B1) |
申请公布日期 |
2001.07.10 |
申请号 |
US20000487897 |
申请日期 |
2000.01.19 |
申请人 |
FUJITSU LIMITED |
发明人 |
WAKANA SHIN-ICHI;MIYAMOTO AKINORI;HAMA SOICHI;OZAKI KAZUYUKI;NAGAI TOSHIAKI |
分类号 |
G01R13/34;G01R31/308;(IPC1-7):G01R31/308 |
主分类号 |
G01R13/34 |
代理机构 |
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主权项 |
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地址 |
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