发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR STRUCTURE HAVING METAL OXIDE INTERFACE WITH SILICON |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing semiconductor structure with which a thin stable silicide interface with silicon can be manufactured. SOLUTION: This method of manufacturing semiconductor structure comprises a step of providing a silicon substrate 10 having a surface 12, a step of forming seed layers 20 and 20' composed of silicide materials on the surface 12 of the substrate 10 by atomic layer deposition(ALD), and a step of forming one or more layers of an oxide 40 having a high dielectric constant on the seed layers 20 and 20' by atomic layer deposition(ALD). |
申请公布号 |
JP2001189312(A) |
申请公布日期 |
2001.07.10 |
申请号 |
JP20000322458 |
申请日期 |
2000.10.23 |
申请人 |
MOTOROLA INC |
发明人 |
RAMDANI JAMAL;DROOPAD RAVINDRANATH;YU ZHIYI JIMMY |
分类号 |
C30B29/16;C30B25/02;H01L21/24;H01L21/316;H01L21/8242;H01L21/8246;H01L21/8247;H01L27/105;H01L27/108;H01L29/78;H01L29/788;H01L29/792 |
主分类号 |
C30B29/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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