| 摘要 |
A low insertion force connector contact assembly (122) has two contacts (136, 144) which are separated by insulation (143) from one another to provide separate circuit paths for separately engaging a mating contact (166) of a mating connector (22) in a Kelvin test configuration. The contact (144) engages the mating contact (166) of the mating connector (22) for applying current and voltage to the mating contact (166). The contact (136) engages the mating contact (166) for measuring the voltages of the mating contact (166). Preferably, the contact (144) is a spring biased plunger which is urged from a retracted position to an extended position. In the extended position, the contact (144) pushes the contact (136) aside of a position for engaging the mating contact (166). When the mating connector (22) is being engaged with the connector assembly (122), the mating contact (166) pushes the spring biased, plunger contact (144) from the extended position to the retracted position, releasing the contact (136) to engage with mating contact (166) with a wipe during a makeup stroke in which the mating contact (166) is engaged within the contact assembly (122). This type of contact assembly connection may be used with mating contacts (166) of various cross sections, such edge connector lands, and square, rectangular and round leads. In a production testing environment, the mating contacts (166) may be cleaned by spraying with a solvent or a discharge of air when being inserted into a connector contact assembly (202).
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