发明名称 |
MANUFACTURING METHOD FOR RESIN-SEALED SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To solve a problem where there has been a limit in the reduction of thickness when a semiconductor device is configured with a lead frame. SOLUTION: A semiconductor element is mounted on a frame member comprising a plurality of land components and an element mounting region, where a semiconductor element is mounted prior to electrical connection and resin- sealing, and then a resin-sealed semiconductor device component 25 is isolated from the frame member. The entire thickness of the resin-sealed semiconductor device component 25 is scraped with a cutting member 27 from the bottom surface side into a desired thickness, so that the bottom surface of a semiconductor element 22 is exposed in the bottom surface region of a sealing resin 24, while the bottom surface of an external electrode 26 is exposed. Thus, an ultra thin resin sealing type semiconductor device is provided. |
申请公布号 |
JP2001189411(A) |
申请公布日期 |
2001.07.10 |
申请号 |
JP20000000252 |
申请日期 |
2000.01.05 |
申请人 |
MATSUSHITA ELECTRONICS INDUSTRY CORP |
发明人 |
FUJIMOTO HIROAKI;NANO MASANORI;ADACHI OSAMU;NOMURA TORU |
分类号 |
H01L23/12;H01L21/48;H01L21/50;H01L23/28;H01L23/50;(IPC1-7):H01L23/50 |
主分类号 |
H01L23/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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