发明名称 MANUFACTURING METHOD FOR RESIN-SEALED SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To solve a problem where there has been a limit in the reduction of thickness when a semiconductor device is configured with a lead frame. SOLUTION: A semiconductor element is mounted on a frame member comprising a plurality of land components and an element mounting region, where a semiconductor element is mounted prior to electrical connection and resin- sealing, and then a resin-sealed semiconductor device component 25 is isolated from the frame member. The entire thickness of the resin-sealed semiconductor device component 25 is scraped with a cutting member 27 from the bottom surface side into a desired thickness, so that the bottom surface of a semiconductor element 22 is exposed in the bottom surface region of a sealing resin 24, while the bottom surface of an external electrode 26 is exposed. Thus, an ultra thin resin sealing type semiconductor device is provided.
申请公布号 JP2001189411(A) 申请公布日期 2001.07.10
申请号 JP20000000252 申请日期 2000.01.05
申请人 MATSUSHITA ELECTRONICS INDUSTRY CORP 发明人 FUJIMOTO HIROAKI;NANO MASANORI;ADACHI OSAMU;NOMURA TORU
分类号 H01L23/12;H01L21/48;H01L21/50;H01L23/28;H01L23/50;(IPC1-7):H01L23/50 主分类号 H01L23/12
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