发明名称 Cylindrical capacitor and method for fabricating same
摘要 A method for fabricating a cylindrical capacitor that exceeds photolithographic resolution. The capacitor is formed by partially etching the storage node opening, thereby reducing the distance between adjacent openings defined by the photolithographic process. The openings defined by the photolithographic process is enlarged by wet etching the sidewalls of the openings by at least the same thickness as that of a subsequently formed conductive layer for storage node formation. Contact plugs that are electrically connected to the bottom of the cylindrical storage nodes protrude from the top surface of an insulating layer in order to increase process margins and decrease contact resistance.
申请公布号 US6258691(B1) 申请公布日期 2001.07.10
申请号 US19990350104 申请日期 1999.07.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM YUN-GI
分类号 H01L27/04;H01L21/02;H01L21/3213;H01L21/8242;H01L27/108;(IPC1-7):H01L21/20 主分类号 H01L27/04
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