发明名称 In-situ electroless copper seed layer enhancement in an electroplating system
摘要 The present invention discloses a system that provides for electroless deposition performed in-situ with an electroplating process to minimize oxidation and other contaminants prior to the electroplating process. The system allows the substrate to be transferred from the electroless deposition process to the electroplating process with a protective coating to also minimize oxidation. The system generally includes a mainframe having a mainframe substrate transfer robot, a loading station disposed in connection with the mainframe, one or more processing facilities disposed in connection with the mainframe, an electroless supply fluidly connected to the one or more processing applicators and optionally includes a spin-rinse-dry (SRD) station, a rapid thermal anneal chamber and a system controller for controlling the deposition processes and the components of the electro-chemical deposition system.
申请公布号 US6258223(B1) 申请公布日期 2001.07.10
申请号 US19990350877 申请日期 1999.07.09
申请人 APPLIED MATERIALS, INC. 发明人 CHEUNG ROBIN;CARL DANIEL A.;DORDI YEZDI;HEY PETER;MORAD RATSON;CHEN LIANG-YUH;SMITH PAUL F.;SINHA ASHOK K.
分类号 C23C18/31;C23C18/52;C25D7/12;H01L21/285;H01L21/288;H01L21/687;(IPC1-7):C25D17/00 主分类号 C23C18/31
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