发明名称 |
Dry etching method and a TFT fabrication method |
摘要 |
A method for etching a hydrogenated amorphous silicon layer and a metal layer formed thereon in a dry etching tool, is described incorporating the steps of selectively etching the metal layer on the hydrogenated amorphous silicon layer and etching the hydrogenated amorphous silicon layer. The invention overcomes the problem of performing sequential dry etching of a metal layer and a hydrogenated amorphous silicon underlayer in a single etching tool.
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申请公布号 |
US6258723(B1) |
申请公布日期 |
2001.07.10 |
申请号 |
US19990271720 |
申请日期 |
1999.03.18 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
TAKEICHI MASATOMO;KITAHARA HIROAKI |
分类号 |
H01L21/302;H01L21/3065;H01L21/3213;H01L21/336;H01L29/417;H01L29/45;H01L29/786;(IPC1-7):H01L21/302 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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