发明名称 Dry etching method and a TFT fabrication method
摘要 A method for etching a hydrogenated amorphous silicon layer and a metal layer formed thereon in a dry etching tool, is described incorporating the steps of selectively etching the metal layer on the hydrogenated amorphous silicon layer and etching the hydrogenated amorphous silicon layer. The invention overcomes the problem of performing sequential dry etching of a metal layer and a hydrogenated amorphous silicon underlayer in a single etching tool.
申请公布号 US6258723(B1) 申请公布日期 2001.07.10
申请号 US19990271720 申请日期 1999.03.18
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 TAKEICHI MASATOMO;KITAHARA HIROAKI
分类号 H01L21/302;H01L21/3065;H01L21/3213;H01L21/336;H01L29/417;H01L29/45;H01L29/786;(IPC1-7):H01L21/302 主分类号 H01L21/302
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