| 摘要 |
PURPOSE: A semiconductor integrated circuit test system is provided to decrease operating test time by testing sequentially a some of semiconductor units installed on one test board. CONSTITUTION: A semiconductor integrated circuit test system is composed of a test board(110), decoder(130), and a some of channels. Two of semiconductor integrated circuits(121,122) is installed on the test board(110). Each of the semiconductor integrated circuits(121, 122) have input/output terminals(AD1 - AD6, IO1 AND IO2) to input address and data from outside or to output address and data to outside. Each of switches (SW11 - SW18) is connected between input/output terminals(AD1 - AD6, IO1 and IO2) of the semiconductor integrated circuit(121) and channels(CH1 - CH6, IO(1) and IO(2)) of the semiconductor integrated test system. The terminals with the same name of the semiconductor integrated circuit is connected with channels of the same name. |
