发明名称 METHOD FOR SIMULTANEOUSLY ETCHING POLY SILICON LAYER AND OXIDE SILICON LAYER
摘要 PURPOSE: A method for simultaneously etching a poly silicon layer and an oxide silicon layer is provided to etch the poly silicon layer and the oxide silicon layer at a same etching speed. CONSTITUTION: A poly silicon layer(16) and an oxide silicon layer(14) are formed on a silicon substrate(10). The poly silicon layer(16) and oxide silicon layer(14) are successively etched in a same etching equipment by C1HmFn(1,m,n: natural number) gas. A ratio of 1 plus m:n is minimum 1:3.
申请公布号 KR20010063238(A) 申请公布日期 2001.07.09
申请号 KR19990060239 申请日期 1999.12.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, BYEONG YEOL;KIM, DONG YUN
分类号 H01L21/306;(IPC1-7):H01L21/306 主分类号 H01L21/306
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