发明名称 |
METHOD FOR SIMULTANEOUSLY ETCHING POLY SILICON LAYER AND OXIDE SILICON LAYER |
摘要 |
PURPOSE: A method for simultaneously etching a poly silicon layer and an oxide silicon layer is provided to etch the poly silicon layer and the oxide silicon layer at a same etching speed. CONSTITUTION: A poly silicon layer(16) and an oxide silicon layer(14) are formed on a silicon substrate(10). The poly silicon layer(16) and oxide silicon layer(14) are successively etched in a same etching equipment by C1HmFn(1,m,n: natural number) gas. A ratio of 1 plus m:n is minimum 1:3.
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申请公布号 |
KR20010063238(A) |
申请公布日期 |
2001.07.09 |
申请号 |
KR19990060239 |
申请日期 |
1999.12.22 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, BYEONG YEOL;KIM, DONG YUN |
分类号 |
H01L21/306;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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