发明名称 |
METHOD FOR MANUFACTURING DAMASCENE GATE TYPE MOS TRANSISTOR USING SELECTIVE EPITAXIAL GROWTH METHOD |
摘要 |
PURPOSE: A method for manufacturing a damascene gate type MOS transistor using a selective epitaxial growth method is provided to form uniformly a thickness of a gate by using a selective epitaxial growth method. CONSTITUTION: A dummy gate pattern is formed on a semiconductor substrate(20) by using a nitride layer. An oxide layer spacer(23) is formed at a sidewall of the dummy gate pattern. A selective epitaxial layer(24a) is formed on the exposed semiconductor substrate(20). An interlayer dielectric(25) is formed on the whole structure. The dummy gate pattern is exposed by flattening the interlayer dielectric(25). The dummy gate pattern is removed. A gate insulating layer(26) and a conductive layer(27) for gate electrode are buried therein.
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申请公布号 |
KR20010064118(A) |
申请公布日期 |
2001.07.09 |
申请号 |
KR19990062251 |
申请日期 |
1999.12.24 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, JEONG HO |
分类号 |
H01L21/336;H01L21/8242;H01L29/78;(IPC1-7):H01L29/78;H01L21/824 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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