发明名称 |
METHOD FOR FORMING THIN FILM USING CVD METHOD AND OPTIMIZING POST-THERMAL DOPING CONDITION |
摘要 |
PURPOSE: A method for forming a thin film using a CVD(Chemical Vapor Deposition) method and optimizing a post-thermal doping condition is provided to optimize a processing condition by using thermodynamic data. CONSTITUTION: A deposition condition of an element forming a sing material/a compound is set up(S10). A balanced partial pressure of a depositing material is obtained according to the deposition condition by using a free energy minimization method(S12). A supersaturated ratio is calculated by dividing the balanced partial pressure into a balanced vapor pressure(S14). The variation according to a pressure or the variation of the supersaturated ratio according to the dopant amount is calculated under a constant temperature(S16). A depositing speed is calculated according to a depositing material and the pressure by comparing the calculated value with measured data(S18).
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申请公布号 |
KR20010064319(A) |
申请公布日期 |
2001.07.09 |
申请号 |
KR19990064487 |
申请日期 |
1999.12.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JUNG, U SEOK;KIM, HAE WON |
分类号 |
H01L21/205;(IPC1-7):H01L21/205 |
主分类号 |
H01L21/205 |
代理机构 |
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主权项 |
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地址 |
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