发明名称 METHOD FOR FORMING THIN FILM USING CVD METHOD AND OPTIMIZING POST-THERMAL DOPING CONDITION
摘要 PURPOSE: A method for forming a thin film using a CVD(Chemical Vapor Deposition) method and optimizing a post-thermal doping condition is provided to optimize a processing condition by using thermodynamic data. CONSTITUTION: A deposition condition of an element forming a sing material/a compound is set up(S10). A balanced partial pressure of a depositing material is obtained according to the deposition condition by using a free energy minimization method(S12). A supersaturated ratio is calculated by dividing the balanced partial pressure into a balanced vapor pressure(S14). The variation according to a pressure or the variation of the supersaturated ratio according to the dopant amount is calculated under a constant temperature(S16). A depositing speed is calculated according to a depositing material and the pressure by comparing the calculated value with measured data(S18).
申请公布号 KR20010064319(A) 申请公布日期 2001.07.09
申请号 KR19990064487 申请日期 1999.12.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG, U SEOK;KIM, HAE WON
分类号 H01L21/205;(IPC1-7):H01L21/205 主分类号 H01L21/205
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