发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to increase a depletion region and a breakdown voltage by reducing a doping density of a junction region. CONSTITUTION: A gate electrode is formed on an upper portion of a semiconductor substrate(11). A low density N type source/drain junction region(19a,19b) is formed by using the gate electrode. An insulating layer spacer(17) is formed at a sidewall of the gate electrode. A plug poly is formed on an upper portion of the whole structure. A contact pad(25) is formed on the low density N-type drain junction region by patterning the plug poly. A source junction region of an LDD structure is formed by implanting high density N-type dopant ions into the low density N-type drain junction region.
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申请公布号 |
KR20010063772(A) |
申请公布日期 |
2001.07.09 |
申请号 |
KR19990061860 |
申请日期 |
1999.12.24 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
HUH, TAE HYEONG;SON, CHAN HO |
分类号 |
H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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