发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to increase a depletion region and a breakdown voltage by reducing a doping density of a junction region. CONSTITUTION: A gate electrode is formed on an upper portion of a semiconductor substrate(11). A low density N type source/drain junction region(19a,19b) is formed by using the gate electrode. An insulating layer spacer(17) is formed at a sidewall of the gate electrode. A plug poly is formed on an upper portion of the whole structure. A contact pad(25) is formed on the low density N-type drain junction region by patterning the plug poly. A source junction region of an LDD structure is formed by implanting high density N-type dopant ions into the low density N-type drain junction region.
申请公布号 KR20010063772(A) 申请公布日期 2001.07.09
申请号 KR19990061860 申请日期 1999.12.24
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HUH, TAE HYEONG;SON, CHAN HO
分类号 H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/78
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