| 摘要 |
PURPOSE: The device and method for the test of the TSI(Time Slot Interchange) chip and MB(Mother Board) chip are provided to directly check the current state of the chip and the pattern of the MB on operating the chip by using a PN(Pseudo Noise) code. CONSTITUTION: A main controller(13) controls the self-test and pattern-test of the TSI chip and MB chip. A decoder(13) decodes the control signal of the main controller. A generator(14) creates the PN code. The first selector(17) chooses and outputs one of the PN code and main data. A pattern-test detector(15) receives the PN code from the first selector, detects the PN code for the pattern-test and runs the pattern-test. A test-mode selector(18) receives the PN code of the main data and generator, and chooses the test-mode. A main processor(19) runs the unique function of the chip in order to test according to the test-mode selected from the test-mode selector. The second selector(20) receives the data from the main processor and runs the self-test. A self-test detector(16) receives the data from the second selector, detects the PN code for the self-test, and runs the self-test.
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