发明名称 METHOD FOR MANUFACTURING FLASH MEMORY DEVICE
摘要 PURPOSE: A method for manufacturing a flash memory device is to prevent a parasitic bipolar action from being produced by forming a low concentration ion implantation region. CONSTITUTION: A p-type semiconductor substrate(31) is implanted with an n-type impurity to form a triple n-well region(32). The substrate is carried out through an ion implantation process by controlling a concentration of a p-type impurity and ion implantation energy, thereby forming the first ion implantation region(33). The substrate with the first ion implantation region formed is implanted with the p-type impurity to form a p-type well region(34). The substrate is carried out through the ion implantation process by controlling a concentration of a n-type impurity and ion implantation energy, thereby forming the second ion implantation region(35). The substrate with the n-type well formed is implanted with the n-type impurity to form a junction region(36).
申请公布号 KR20010061413(A) 申请公布日期 2001.07.07
申请号 KR19990063907 申请日期 1999.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHO, BYEONG HUI;KIM, JONG U;PARK, BYEONG SU;SHIN, YEONG GI
分类号 H01L27/115;(IPC1-7):H01L27/115 主分类号 H01L27/115
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