发明名称 |
METHOD FOR MANUFACTURING FLASH MEMORY DEVICE |
摘要 |
PURPOSE: A method for manufacturing a flash memory device is to prevent a parasitic bipolar action from being produced by forming a low concentration ion implantation region. CONSTITUTION: A p-type semiconductor substrate(31) is implanted with an n-type impurity to form a triple n-well region(32). The substrate is carried out through an ion implantation process by controlling a concentration of a p-type impurity and ion implantation energy, thereby forming the first ion implantation region(33). The substrate with the first ion implantation region formed is implanted with the p-type impurity to form a p-type well region(34). The substrate is carried out through the ion implantation process by controlling a concentration of a n-type impurity and ion implantation energy, thereby forming the second ion implantation region(35). The substrate with the n-type well formed is implanted with the n-type impurity to form a junction region(36).
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申请公布号 |
KR20010061413(A) |
申请公布日期 |
2001.07.07 |
申请号 |
KR19990063907 |
申请日期 |
1999.12.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHO, BYEONG HUI;KIM, JONG U;PARK, BYEONG SU;SHIN, YEONG GI |
分类号 |
H01L27/115;(IPC1-7):H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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