发明名称 FERROELECTRIC MEMORY DEVICE HAVING SPIN ON GLASS LAYER ON METAL LINE AND METHOD FOR MANUFACTURING THE SAME
摘要 PURPOSE: A ferroelectric memory device having a spin on glass layer on a metal line and a method for manufacturing the same are provided to prevent a short-circuit between metals by improving the flatness of an insulating layer between metal lines. CONSTITUTION: A transistor is formed on a semiconductor substrate(10). An interlayer dielectric covers the transistor. A ferroelectric capacitor including a lower electrode(11), a ferroelectric layer(12), and an upper electrode(13) is formed on the interlayer dielectric. An insulating layer(15) covers the ferroelectric capacitor. A SiON layer(16) is formed on the insulating layer(15). The ferroelectric capacitor is connected with the transistor by a metal line. A USG(Undoped Silicate Glass) layer(20) covers the metal line and the SiON layer(16). A SOG layer(21) is formed on the USG layer.
申请公布号 KR20010061370(A) 申请公布日期 2001.07.07
申请号 KR19990063864 申请日期 1999.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YOON, YANG HAN
分类号 H01L27/105;(IPC1-7):H01L27/105 主分类号 H01L27/105
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