发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A manufacturing method of a semiconductor device is to prevent bad opening of a cell region between highly integrated gate patterns. CONSTITUTION: A gate electrode and a mask oxide layer are formed on a semiconductor substrate(21) in this order. The mask oxide layer is selectively etched to form a mask oxide layer pattern(26a). The gate electrode is etched using the mask oxide layer pattern as an etch barrier to form a gate electrode pattern(24a,25a). The mask oxide layer pattern of a predetermined width is then wet-etched. A sidewall oxide layer is deposited on the entire surface of the resultant structure and etched to form a spacer(29) at a sidewall of the gate electrode pattern. Thereafter, polysilicon is deposited on the entire surface and selectively etched to form a plug pattern(30) burying a hole between the gate electrode patterns.
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申请公布号 |
KR20010061262(A) |
申请公布日期 |
2001.07.07 |
申请号 |
KR19990063753 |
申请日期 |
1999.12.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JUN, WON CHEOL;KIM, GEUN GUK |
分类号 |
H01L21/3205;(IPC1-7):H01L21/320 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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