发明名称 |
MANIPULATOR FOR INSPECTING SEMICONDUCTOR WAFER |
摘要 |
PURPOSE: A manipulator for inspecting a semiconductor wafer is provided to enhance test reliability with low price and easy adjustment by enabling a test head to be elevated and rotated. CONSTITUTION: An upper frame(10) is mounted with the first driving motor(11) and a pair of arms(12) for gripping a test head. A number of connecting plates(12a) is arranged between the arms(12). Each of the connecting plates(12a) is respectively fixed by the arms(12) to form a space. A transmission(13) is connected to an upper side of the first driving motor(11), and the transmission(13) transmits a rotational force from the first driving motor to the each arm(12). A test head(14) is mounted between the arms(12). The rotation force from the first motor(11) is transmitted to the arms(12), and the test head(14) is rotationally displaced together with the arms(12). A number of legs(15) are arranged at both lower parts of the frame(10). A number of shafts(21) are mounted as opposed to the legs(15), and inserted into guide holes of the legs(15) to guide vertical motion of the frame(10).
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申请公布号 |
KR20010061049(A) |
申请公布日期 |
2001.07.07 |
申请号 |
KR19990063528 |
申请日期 |
1999.12.28 |
申请人 |
ILAB |
发明人 |
BONG, TAE GEUN;HAN, DONG YEONG;HUH, MU YONG;KIM, YEONG SEON;PARK, BEOM UK |
分类号 |
H01L21/66;(IPC1-7):H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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地址 |
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