发明名称 SIGNAL GENERATING DEVICE FOR TESTING INTER-PROCESSOR COMMUNICATION PATH IN EXCHANGE
摘要 PURPOSE: A signal generating device for testing an IPC(Inter-Processor Communication) path in an exchange is provided to generate a signal for testing faults of an exchange IPC path, and to reproduce the situation of external noise inputted to an IPC path, the interference between signals passing the IPC path, a reflected wavelength of the IPC path. CONSTITUTION: A clock generator(100) comprises a clock divider(101), coupling resistances(R101,R102,R103) and a clock buffer(102), and generates a clock corresponding to external noise. A control signal generator(110) comprises a pull-up resistance(R112) and switches(S111,S112,113,S114), and generates a control signal for controlling an output of a differential driving circuit. Coupling resistances(R104-R111) inputs a noise signal driven in differential to an IPC(Inter-Processor Communication) cable.
申请公布号 KR20010060867(A) 申请公布日期 2001.07.07
申请号 KR19990063324 申请日期 1999.12.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, JAE AM
分类号 H04M3/26;(IPC1-7):H04M3/26 主分类号 H04M3/26
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