发明名称 TEST CONNECTOR WITH HIGH INTERCONNECTION DENSITY FOR INTEGRATED CIRCUITS
摘要 PURPOSE: A test connector is provided to ensure equal supporting force for all pins even in the case where a contact surface has imperfect flatness, by ensuring an almost constant supporting force independently of expansion of the end portion of pin. CONSTITUTION: A plate supports a multiplicity of conductive pins one of the ends of which forms a contact zone with the electronic circuit to be tested and the other end forms a contact zone with a connecting plate that has a connection element with the test equipment, with the conductive pins presenting a form that is capable of ensuring flexibility and including a longitudinal component, characterized in that the pins present a succession of at least three arc-shaped sections(4,5,6) in alternating directions extended on both sides by rectilinear segments(2,3) that are mobile according to one degree of freedom in axial translation, with the pins being inserted in the front plates.
申请公布号 KR20010062354(A) 申请公布日期 2001.07.07
申请号 KR20000075584 申请日期 2000.12.12
申请人 UPSYS PROBE TECHNOLOGY SAS 发明人 GEORGE ISABELLE;JURINE JEAN MICHEL
分类号 G01R31/26;G01R1/067;G01R1/073;G01R3/00;H01L21/66;(IPC1-7):H01R13/02 主分类号 G01R31/26
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