发明名称 FILM FORMING METHOD AND SEMICONDUCTOR DEVICE
摘要 PURPOSE: A film forming method and semiconductor device are provided to form an insulating film containing silicon on the substrate by to performing plasma the compound having the siloxane bonds and the oxidizing gas to react with each other. CONSTITUTION: A chamber(101) is used to form the film, and two opposing electrodes(102) and an upper electrode(104) are provided in the chamber(101). Here, the lower electrode(102) serves also as a loading table on which a substrate(103) is loaded. A heater for heating the substrate(103) up to the desired temperature is built in the lower electrode(102). A power supplying lines(105) supply a power to the heater. The upper electrode(104) serves also as a shower head that supplies a gas to an interior of the chamber(101). A first high-frequency power supply(107) and a second high-frequency power supply(109) are connected to these two electrodes(104,102) respectively. The gas in the camber(101) can be performed plasma by supplying a high-frequency power to the gas in the chamber(101) from one of these high-frequency power supplies(107, 109), or from both the power supplies.
申请公布号 KR20010062710(A) 申请公布日期 2001.07.07
申请号 KR20000082075 申请日期 2000.12.26
申请人 CANON SALES CO., INC.;SEMICONDUCTOR PROCESS LABORATORY CO., LTD. 发明人 IKAKURA HIROSHI;KOTAKE YUICHIRO;MAEDA KAZUO;OHGAWARA SHOJI;OHIRA KOUICHI;SHIOYA YOSHIMI;SUZUKI TOMOMI;YAMAMOTO YOUICHI
分类号 C23C16/30;C23C16/40;H01L21/31;H01L21/311;H01L21/312;H01L21/314;H01L21/316;H01L21/768;(IPC1-7):H01L21/31 主分类号 C23C16/30
代理机构 代理人
主权项
地址