发明名称 |
ELECTROSTATIC PROTECTION DEVICE |
摘要 |
PURPOSE: An electrostatic protection device is provided to improve the reliability of a device by increasing tolerance to a CDM(Charged Device Model) and an ESD(ElectroStatic Discharge). CONSTITUTION: An input buffer(50) is composed by forming a gate electrode and a source/drain region(55) including an n+ diffusion layer on an upper portion of a p-well(51). A diode is comprised by forming the n+ diffusion layer(55) connected with the gate electrode of the input buffer(50) and a p+ diffusion layer(54) connected with a grounding end(Vss) at both sides of the input buffer(50). An n-well guard ring(52) is composed by forming a p+ diffusion layer(54) connected with the n+ diffusion layer(53) of the diode and the n+ diffusion layer(53) connected with a power end(Vcc).
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申请公布号 |
KR20010061079(A) |
申请公布日期 |
2001.07.07 |
申请号 |
KR19990063563 |
申请日期 |
1999.12.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
BAE, SE YEOL;LEE, HYEON U |
分类号 |
H01L27/04;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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