发明名称 |
METHOD FOR FORMING METAL LINE HAVING DIELECTRICS OF VAPOR PHASE BY USING DUAL DAMASCENE PROCESS |
摘要 |
PURPOSE: A method for forming a metal line having the dielectrics of vapor phase by using a dual damascene process is provided to improve the integration density of a high-integrated device and the property of the device by applying a sealing oxide of high transmissivity and the dual damascene process simultaneously. CONSTITUTION: A dual damascene process is applied to form a dielectric of vapor phase by a carbon ashing. The oxide of one material selected from the group of Zr, Ce, Mg, Ca and Gd, or the oxide of the compound that is mixed at least two materials selected from the group is applied as the first sealing oxide(103) and the second sealing oxide(105).
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申请公布号 |
KR20010061584(A) |
申请公布日期 |
2001.07.07 |
申请号 |
KR19990064080 |
申请日期 |
1999.12.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, GI HYEON;KIM, JONG HUN;KIM, SANG IK |
分类号 |
H01L21/283;(IPC1-7):H01L21/283 |
主分类号 |
H01L21/283 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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