| 摘要 |
PURPOSE: The device and method for the BIST(Built-in-Self-Test) of the multi-port RAM is provided to read and test the data, recorded by each writing port, on a reading port after dividing the cycle necessary to read the whole address and memory into the fixed interval by using one BIST. CONSTITUTION: The BIST(10) divides the cycle, necessary to read the whole address and memory, into the fixed interval, and outputs the specified signal testing the multi-port RAM(40) by recording and reading the data on the multi-port RAM according to the cycle and interval. Many multiplexers(20,30), controlled by BIST enable signals(bist1_en, bist2_en), selects a normal path inputs or the outputs of the BIST.
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