发明名称 METHOD FOR SEARCHING DEFECT GENERATION HISTORY OF MEMORY MANAGEMENT UNIT IN MOBILE COMMUNICATION EXCHANGE
摘要 PURPOSE: A method for searching a defect generation history of a memory management unit in a mobile communication exchange is provided to improve a debugging environment by tracking easily a cause of a defect of an MMU(Memory Management Unit). CONSTITUTION: A stack start/end address and a text end address(ssa/sea) are obtained by using TCB information when a defect of an MMU is generated(101-102). A frame pointer(fp) is obtained before a fault is generated(103-104). A physical address(pfp) of fp is obtained according to fp<ssa or fp>ssa(105-106). A call address(cad) is obtained by using the pfp when i=0 if not the pfp=0(107-109). A value of the cad is displayed if not cad<0 or cad>0, the pfp is used, and an address(nfp) stored in the next frame pointer is obtained from the next stack(110-112). A physical address(npfp) of the nfp is obtained if not nfp<ssa or nfp>sea(113-114). An npf and pfp size(len) are obtained and contents of the stack are displayed as much as the len if not npfp=0(115-117). The cad is obtained if i<4.
申请公布号 KR20010058971(A) 申请公布日期 2001.07.06
申请号 KR19990066348 申请日期 1999.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUN, MAN SU
分类号 H04W24/00;(IPC1-7):H04Q7/34 主分类号 H04W24/00
代理机构 代理人
主权项
地址