| 摘要 |
PURPOSE: A grid scan cell and a chip test device are provided to effectively reduce a test time using the grid scan cell which enable data processes in multi-directions. CONSTITUTION: A multiplexer(510) selects an X-directional scan data(Scan_data_x), and the selected data are synchronized and outputted with a clock signal(Clock) through a flip-flop(500) when a control signal(Scan_x_en) is enabled as "1". Then, X-directional data path is formed. The multiplexer(510) selects a Y-directional scan data(Scan_data_y), and the selected data are synchronized and outputted with the clock signal(Clock) through the flip-flop(500) when a control signal(Scan_y_en) is enabled as "1". Then, Y-directional data path is formed. The multiplexer(510) selects a Z-directional scan data(Scan_data_z), and the selected data are synchronized and outputted with the clock signal(Clock) through the flip-flop(500) when a control signal(Scan_z_en) is enabled as "1". Then, Z-directional data path is formed. The multiplexer(510) selects a data signal(data_in), and the selected data are synchronized and outputted with the clock signal(Clock) through the flip-flop(500) when a control signal(Data_en) is enabled as "1". Then, a general data path is formed. |
