发明名称 METAL LAYER OF SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME
摘要 PURPOSE: A metal layer of a semiconductor device and a method for forming the same are provided to improve an optical contrast by increasing a mirror fill factor and flattening a mirror metal layer. CONSTITUTION: A flattened protective layer(34) is formed on a semiconductor substrate(31) including a transistor and a capacitor electrode(33). An absorption layer(36) is formed on the flattened protective layer(34). An insulating layer(35) is formed on an upper face of the absorption layer(36). A via hole is formed on the flattened protective layer(34) and the insulating layer(35) to expose a part of the capacitor electrode(33). A tungsten plug(38a) and a flattened buried layer(39) are formed within the via hole. A mirror metal layer(40) is formed on the insulating layer(35) and the flattened buried layer(39). An insulating layer spacer(42) is formed on the mirror metal layer(40).
申请公布号 KR20010059929(A) 申请公布日期 2001.07.06
申请号 KR19990067468 申请日期 1999.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YANG, DAE GEUN
分类号 H01L21/3205;H01L21/768;(IPC1-7):H01L21/768 主分类号 H01L21/3205
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