发明名称 |
TRANSISTOR OF SEMICONDUCTOR DEVICE USING SELECTIVE EPITAXIAL LAYER AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A transistor of a semiconductor device and a manufacturing method thereof are to form a deep junction region in the middle region between gate lines and to form a shallow junction region between the deep junction region and a gate spacer, thereby reducing leakage current while improving an SCE(short channel effect). CONSTITUTION: A substrate(34) is provided with an active region and a field region. In the field region is formed a trench(36) with which an insulating layer is filled to form an isolation layer(38). On the active region are successively formed a gate insulating layer, the first/second gate conductive layers and a gate passivation layer, and using a photolithography, a gate line(42) consisting of a gate insulating layer pattern(42a), the first/second gate conductive layers patterns and a gate passivation layer pattern are formed thereafter. On the resultant structure, a spacer substance layer is formed and then anisotropically etched to form a gate spacer(44) until the surface of the substrate is exposed.
|
申请公布号 |
KR20010058666(A) |
申请公布日期 |
2001.07.06 |
申请号 |
KR19990066020 |
申请日期 |
1999.12.30 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, TAE HUI;LEE, GIL GWANG;PARK, JEONG U;SONG, WON SANG;YOO, JAE YUN |
分类号 |
H01L27/085;(IPC1-7):H01L27/085 |
主分类号 |
H01L27/085 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|