| 摘要 |
PROBLEM TO BE SOLVED: To provide a system capable of specifying a circuit for diagnosing packages in a device and easily specifying a faulty package. SOLUTION: When a diagnostic bit is allocated to each package and passed through each package in a station device composed of a plurality of packages 1, 2,..., diagnostic information is added to the allocated bit and a checking circuit 100 checks the diagnostic bit to discriminate the package being the cause of failure. In a line test, the problem that a circuit scale becomes large or the like because a checking circuit has to be provided in each package to discriminate the faulty package can be dealt with by one checking circuit even when the number of packages is large by adding the diagnostic bit to each package. Thus a package is efficiently designed and the number of parts is reduced, then cost is reduced and the faulty package is easily specified.
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