发明名称 |
METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a capacitor of a semiconductor device is provided to increase a capacitance by forming a storage electrode as a hemispheral silicate glass and a TaSiN layer/TaON layer/TaSiN layer as a diffusion barrier. CONSTITUTION: A cylindrical storage electrode having a hemispheral silicate glass is formed on a semiconductor substrate(12). The first TaSiN layer as a diffusion barrier is formed on a whole surface of the structure. Storage electrodes are isolated by etching the first TaSiN layer. A TaON layer as a dielectric layer is formed on the whole surface of the structure. The second TaSiN layer as the diffusion barrier is formed on the TaON layer. A plate electrode(30) is formed on the second TaSiN layer.
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申请公布号 |
KR20010059285(A) |
申请公布日期 |
2001.07.06 |
申请号 |
KR19990066677 |
申请日期 |
1999.12.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JUN, SEUNG JUN;SHIN, DONG U |
分类号 |
H01L27/108;H01L21/02;H01L21/285;H01L21/314;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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