发明名称 METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a capacitor of a semiconductor device is provided to increase a capacitance by forming a storage electrode as a hemispheral silicate glass and a TaSiN layer/TaON layer/TaSiN layer as a diffusion barrier. CONSTITUTION: A cylindrical storage electrode having a hemispheral silicate glass is formed on a semiconductor substrate(12). The first TaSiN layer as a diffusion barrier is formed on a whole surface of the structure. Storage electrodes are isolated by etching the first TaSiN layer. A TaON layer as a dielectric layer is formed on the whole surface of the structure. The second TaSiN layer as the diffusion barrier is formed on the TaON layer. A plate electrode(30) is formed on the second TaSiN layer.
申请公布号 KR20010059285(A) 申请公布日期 2001.07.06
申请号 KR19990066677 申请日期 1999.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUN, SEUNG JUN;SHIN, DONG U
分类号 H01L27/108;H01L21/02;H01L21/285;H01L21/314;(IPC1-7):H01L27/108 主分类号 H01L27/108
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