发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to improve stability of a manufacturing process by using a self-aligned contact method. CONSTITUTION: An etching barrier(19) is formed on a semiconductor substrate(11). An interlayer dielectric is formed on the etching barrier(19). The interlayer dielectric is etched by using a contact mask as etching mask. An interlayer dielectric pattern(21b) is formed between an upper portion of a conductive line and the conductive line. A spacer(23b) is formed at a sidewall of the interlayer dielectric pattern(21b). The interlayer dielectric pattern(21b) and the etching barrier(19) are removed by performing an etching process. A contact hole is formed thereby. A contact plug is formed to bury the contact hole.
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申请公布号 |
KR20010059016(A) |
申请公布日期 |
2001.07.06 |
申请号 |
KR19990066394 |
申请日期 |
1999.12.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
BAE, GYEONG JIN;HUH, JUN HO |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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主权项 |
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地址 |
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