发明名称 CONTACT STRUCTURE OF IC SOCKET
摘要 PROBLEM TO BE SOLVED: To provide a contact structure of IC socket which can keep a uniform contact, even if an IC package is warped by the heat applied at the burn-in test or the like. SOLUTION: Partial deterioration of a contact 4 is prevented by forming a surface 4a of a contact 4, formed by an elastic body 7 of electric conductive rubber and film, into curvature shape in conformity with the warpage of a specified IC package 1a, and by making an IC lead contact closely with the contact 4.
申请公布号 JP2001185259(A) 申请公布日期 2001.07.06
申请号 JP19990377197 申请日期 1999.12.27
申请人 DAITO:KK 发明人 KURIHARA MITSUGI
分类号 H01R11/01;G01R1/073;G01R31/26;H01L23/32;H01R33/76;(IPC1-7):H01R11/01 主分类号 H01R11/01
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